ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,542, issued on Sept. 29, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Operation method of memory, and memory, mem... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,543, issued on Sept. 29, was assigned to Hefei Core Storage Electronic Ltd. (Anhui, China). "Voltage adjustment method, memory storage dev... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,544, issued on Sept. 29, was assigned to Kioxia Corp. (Tokyo). "Semiconductor memory device" was invented by Tetsuaki Utsumi (Yokohama, Ja... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,545, issued on Sept. 29, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Semiconductor memory device and operating method thereof... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,546, issued on Sept. 29, was assigned to Kioxia Corp. (Tokyo). "Memory system and control method thereof" was invented by Hisaki Niikura (... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,547, issued on Sept. 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "High-density and high-voltage-tol... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,548, issued on Sept. 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Bit selection for power reduction... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,549, issued on Sept. 29, was assigned to Kioxia Corp. (Tokyo). "Semiconductor system and wiring defect detecting method" was invented by K... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,550, issued on Sept. 29, was assigned to LG Electronics Inc. (Seoul, South Korea). "Image display device" was invented by Wonsang Jeong (S... और पढ़ें
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,551, issued on Sept. 29, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Semiconductor system for detecting fail location" was in... और पढ़ें